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Title: Raman and photo-modulated reflectivity studies of ZnTe/InAs semiconductor heterostructure under hydrostatic pressure

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:7016994
; ; ;  [1]; ;  [2]; ; ;  [3]
  1. Department of Physics and Astronomy, University of Missouri---Columbia, Columbia, Missouri 65211 (United States)
  2. Department of Physics, Purdue University, West Lafayette, Indiana 47907 (United States)
  3. School of Electrical Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)

The photo--modulated reflectivity spectrum of a biaxially-strained pseudomorphic ZnTe epilayer, grown on an InAs epilayer by molecular beam epitaxy is studied as a function of applied hydrostatic pressure at 80 K. With increasing hydrostatic compression, the biaxially compressive strain is progressively compensated by the pressure induced tensile strain. At approximately 55 kbars the epilayer becomes strain free, and is under a biaxial tension at higher pressures. The separation between the heavy hole and light hole signatures is superlinear in pressure, suggestive of a pressure dependent shear deformation potential constant for the valence and conduction bands. We also compare the pressure dependence of the Raman LO phonon of the ZnTe epilayer on InAs with that of a bulk ZnTe sample at 13 K. The pressure dependent strain is found to be linear. Accurate values of the first order strain derivatives of the LO-phonons and mode Grueneisen constants are obtained. [copyright] 1994 American Institute of Physics

DOE Contract Number:
FG02-89ER45402
OSTI ID:
7016994
Report Number(s):
CONF-921145-; CODEN: APCPCS
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 309:1; Conference: Production and neutralization of negative ions and beams, Upton, NY (United States), 9-13 Nov 1992; ISSN 0094-243X
Country of Publication:
United States
Language:
English