Absolute cross-section measurements for electron-impact single ionization of Si[sup 4+] and Si[sup 5+]

Journal Article · Mon Aug 01 00:00:00 EDT 1994 · Physical Review A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.50.1377· OSTI ID:7014705

Thompson, J S ^[1]; Gregory, D C ^[2]

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1. Joint Institute for Laboratory Astrophysics of the University of Colorado and the National Institute for Standards and Technology, Boulder, Colorado 80309-0440 (United States)
2. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)

Experimental measurements of absolute cross sections are presented for electron-impact single ionization of Si[sup 4+] and Si[sup 5+]. The incident electron energies range from below threshold to 1500 eV. The measurements were performed using the crossed ion-electron beams apparatus at the Oak Ridge National Laboratory Electron-Cyclotron Resonance Ion-Source Facility. The data are in reasonable agreement with cross sections calculated using the Lotz semiempirical formula. Reduced cross sections for the isoelectronic targets, Si[sup 4+] and Ar[sup 8+], are compared in order to test classical scaling for direct electron-impact single ionization.

• DOE Contract Number: AI05-86ER53237; AC05-84OR21400
• OSTI ID: 7014705
• Journal Information: Physical Review A; (United States), Journal Name: Physical Review A; (United States) Vol. 50:2; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

664300* -- Atomic & Molecular Physics-- Collision Phenomena-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ARGON
ATOMS
CHARGED PARTICLES
COLLISIONS
COMPARATIVE EVALUATIONS
CROSS SECTIONS
ELECTRON COLLISIONS
ELECTRON-ION COLLISIONS
ELEMENTS
ENERGY RANGE
EVALUATION
FLUIDS
GASES
ION COLLISIONS
IONIZATION
IONS
ISOELECTRONIC ATOMS
KEV RANGE
MULTICHARGED IONS
NONMETALS
RARE GASES
SCALING LAWS
SEMIMETALS
SILICON
SILICON IONS