Dielectronic recombination of highly charged ions using an electron beam ion trap
Dielectronic Recombination is an important electron-ion recombination process which affects many aspects of plasmas. This work presents experimental measurements of relative dielectronic recombination cross sections for three highly charged ions: hydrogenlike argon (Ar[sup 17+]), heliumlike argon (Ar[sup 16+]), and neonlike xenon (Xe[sup 44+]). The dielectronic recombination cross sections are compared to theoretical resonance strengths. Excellent agreement is found overall. The energy resolution of the experimental measurements is 18 eV FWHM. These experiments make use of the ion extraction system recently installed on the Electron Beam Ion Trap (EBIT). With this technique the interactions are measured through measurement of relative ion populations rather than relative x-ray intensities.
- Research Organization:
- Lawrence Livermore National Lab., CA (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 7010953
- Report Number(s):
- UCRL-LR-110877; ON: DE92041090
- Country of Publication:
- United States
- Language:
- English
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Dielectronic recombination of highly charged ions using an electron beam ion trap
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Related Subjects
664400 -- Experimentally Derived Information on Atomic & Molecular Properties-- (1992-)
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700380* -- Elementary & Classical Processes in Plasmas-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ARGON IONS
CHARGED PARTICLES
COLLISIONS
CROSS SECTIONS
DATA
ELECTRON BEAM ION SOURCES
ELECTRON COLLISIONS
ELECTRON-ION COLLISIONS
EXPERIMENTAL DATA
INFORMATION
ION COLLISIONS
ION SOURCES
IONS
MULTICHARGED IONS
NUMERICAL DATA
RECOMBINATION
XENON IONS