Dielectronic recombination of highly charged ions using an electron beam ion trap
Dielectronic Recombination is an important electron-ion recombination process which affects many aspects of plasmas. This work presents experimental measurements of relative dielectronic recombination cross sections for three highly charged ions: hydrogenlike argon (Ar{sup 17+}), heliumlike argon (Ar{sup 16+}), and neonlike xenon (Xe{sup 44+}). The dielectronic recombination cross sections are compared to theoretical resonance strengths. Excellent agreement is found overall. The energy resolution of the experimental measurements is 18 eV FWHM. These experiments make use of the ion extraction system recently installed on the Electron Beam Ion Trap (EBIT). With this technique the interactions are measured through measurement of relative ion populations rather than relative x-ray intensities.
- Research Organization:
- Lawrence Livermore National Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 10183282
- Report Number(s):
- UCRL-LR--110877; ON: DE92041090
- Country of Publication:
- United States
- Language:
- English
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Dielectronic recombination of highly charged ions using an electron beam ion trap
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Related Subjects
664400
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700380
74 ATOMIC AND MOLECULAR PHYSICS
ARGON IONS
COLLISION PHENOMENA
CROSS SECTIONS
ELECTRON BEAM ION SOURCES
ELECTRON-ION COLLISIONS
ELEMENTARY AND CLASSICAL PROCESSES IN PLASMAS
EXPERIMENTAL DATA
EXPERIMENTALLY DERIVED INFORMATION ON ATOMIC AND MOLECULAR PROPERTIES
MULTICHARGED IONS
RECOMBINATION
XENON IONS