X ray microimaging by diffractive techniques

Technical Report · Mon Jan 01 04:00:00 EST 1990

DOI:https://doi.org/10.2172/7005623· OSTI ID:7005623

The first year of the research program resulted in significant progress on several fronts. We had a rapid start, because the soft x-ray undulator beamline, X1A, at the National Synchrotron Light Source became operational shortly before the start of the grant period. In microimaging by diffraction, Dr. David Sayre was successful in recording moderately large angle diffraction patterns from single diatom specimens. The patterns (Fig. 1) correspond to information down to the 70 Angstrom level, and are by far the best achieved to date. To obtain these, a new diffraction camera was constructed and commissioned. It features a multiple pinhole collimator to define a 10 micron diameter beam, and an alignment system to position the 2 micron specimen within it. 2 figs.

• Research Organization: State Univ. of New York, Albany, NY (USA). Research Foundation
• Sponsoring Organization: DOE/ER
• DOE Contract Number: FG02-89ER60858
• OSTI ID: 7005623
• Report Number(s): DOE/ER/60858-T1; ON: DE90008444
• Country of Publication: United States
• Language: English

Related Subjects

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440100 -- Radiation Instrumentation
440600 -- Optical Instrumentation-- (1990-)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
47 OTHER INSTRUMENTATION
ACCELERATORS
BEAM DYNAMICS
BREMSSTRAHLUNG
BUDGETS
COATINGS
COOLING SYSTEMS
CYCLIC ACCELERATORS
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ENERGY SYSTEMS
FOURIER ANALYSIS
HOLOGRAPHY
IMAGE PROCESSING
IONIZING RADIATIONS
MEASURING METHODS
NSLS
OPTIMIZATION
PROCESSING
PROGRESS REPORT
PROTECTIVE COATINGS
RADIATION SOURCES
RADIATIONS
RESEARCH PROGRAMS
STABILITY
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
TEMPERATURE EFFECTS
X RADIATION