A method for sizing sub-micron particles using small angle diffraction of soft x-rays

Technical Report · Sat Oct 01 04:00:00 EDT 1988

DOI:https://doi.org/10.2172/6137022· OSTI ID:6137022

Berkeland, D J; Underwood, J H; Perera, R C.C.

The purpose of this work is to develop a method of sizing sub-micron particles using small-angle soft x-ray diffraction. Solid poly-styrene spheres of known sizes were used as scattering samples, with C-K..cap alpha.. (44.8/angstrom/) and V-L..cap alpha.. (24.3/angstrom/) radiation from a conventional x-ray source. Two devices were used to diffract the x-rays. One collimates the radiation using a series of pinholes immediately preceding the sample, and directs the unfocussed radiation onto film placed far from the sample. The other utilizes radiation from a single pinhole above the source onto the sample and a spherical multilayer mirror in series, so that the radiation passes twice through the sample and is focused onto film immediately above the pinhole assembly to increase the effective sample area. Using the latter device, two types of diffraction patterns were obtained: a sharp, relatively small pattern from spheres which form a hexagonal lattice structure, and a diffuse, larger pattern from an unordered, or random, array of spheres. Both patterns are presented in this work, along with the calculations, based upon light scattering from an unordered and an ordered array of particles, of the scattering patterns. 9 refs., 32 figs., 2 tabs.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6137022
• Report Number(s): LBL-26220; ON: DE89013353
• Country of Publication: United States
• Language: English

Related Subjects

656003* -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
EQUIPMENT
OPTICAL PROPERTIES
PARTICLE SIZE
PARTICLES
PHYSICAL PROPERTIES
RADIATION SOURCES
REFRACTIVITY
SCATTERING
SIZE
SMALL ANGLE SCATTERING
X-RAY DIFFRACTION
X-RAY EQUIPMENT
X-RAY SOURCES