The use of the in-field critical current density, J{sub c}(0.1 T), as a better descriptor of (Bi, Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x}/Ag tape performance
- Applied Superconductivity Center, University of Wisconsin--Madison, Madison, Wisconsin 53706 (United States)
Extended voltage{endash}current characteristics of 13 optimized (Bi,&hthinsp;Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x}/Ag multifilamentary tapes from four different manufacturers were extensively evaluated so as to extract the field-dependent J{sub c}(H), the characteristic field H{sub p} obtained from the relation J{sub c}{approximately}exp({minus}H/H{sub p}), and the irreversibility field H{sup {asterisk}}. Values of the self-field critical current density J{sub c}(0&hthinsp;T,&hthinsp;77&hthinsp;K) ranged from 12 to 63 kA/cm{sup 2}, I{sub c}(0&hthinsp;T,77&hthinsp;K) from 11 to 139 A, H{sub p} from 128 to 204 mT, and H{sup {asterisk}} from 163 to 369 mT, this range thus being representative of present optimized composites. Self-field can strongly dominate J{sub c}(H) in fields below 20 mT; thus, J{sub c}(0&hthinsp;T,77&hthinsp;K) is a flawed parameter for characterizing tapes because of its very heavy dependence on self-field. We propose that a much better descriptor of tape performance is J{sub c}(0.1&hthinsp;T,77&hthinsp;K), because it lies outside the self-field and weak-link-destruction regimes and clearly within the flux-pinning-controlled domain where the connectivity-determined active cross-section carrying current is constant. {copyright} {ital 1999 American Institute of Physics.}
- OSTI ID:
- 698935
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 20 Vol. 75; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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