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The use of the in-field critical current density, J[sub c](0. 1 T), as a better descriptor of (Bi, Pb)[sub 2]Sr[sub 2]Ca[sub 2]Cu[sub 3]O[sub x]/Ag tape performance

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.125266· OSTI ID:5941683
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  1. Applied Superconductivity Center, University of Wisconsin--Madison, Madison, Wisconsin 53706 (United States)

Extended voltage[endash]current characteristics of 13 optimized (Bi, hthinsp;Pb)[sub 2]Sr[sub 2]Ca[sub 2]Cu[sub 3]O[sub x]/Ag multifilamentary tapes from four different manufacturers were extensively evaluated so as to extract the field-dependent J[sub c](H), the characteristic field H[sub p] obtained from the relation J[sub c][approximately]exp([minus]H/H[sub p]), and the irreversibility field H[sup [asterisk]]. Values of the self-field critical current density J[sub c](0 hthinsp;T, hthinsp;77 hthinsp;K) ranged from 12 to 63 kA/cm[sup 2], I[sub c](0 hthinsp;T,77 hthinsp;K) from 11 to 139 A, H[sub p] from 128 to 204 mT, and H[sup [asterisk]] from 163 to 369 mT, this range thus being representative of present optimized composites. Self-field can strongly dominate J[sub c](H) in fields below 20 mT; thus, J[sub c](0 hthinsp;T,77 hthinsp;K) is a flawed parameter for characterizing tapes because of its very heavy dependence on self-field. We propose that a much better descriptor of tape performance is J[sub c](0.1 hthinsp;T,77 hthinsp;K), because it lies outside the self-field and weak-link-destruction regimes and clearly within the flux-pinning-controlled domain where the connectivity-determined active cross-section carrying current is constant. [copyright] [ital 1999 American Institute of Physics.]

OSTI ID:
5941683
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 75:20; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English