Surface characterization of silicon nitride and silicon carbide powders
The nature and composition of the surfaces of silicon nitride and silicon carbide powders were investigated using high voltage and high resolution transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), and secondary ion mass spectrometry (SIMS). An amorphous oxide (or oxygen-rich) layer, approx. =3-5 nm thick, present on the powder surfaces forms strong bridges between particles. Both XPS and SIMS show that oxygen is the major impurity on the powder surfaces, but minor impurities such as chlorine, fluorine, carbon, iron and sodium are also revealed. The extent of the oxide layer was reduced substantially by washing the powder in anhydrous hydrofluoric acid or by treatment in an argon/hydrogen gas mixture at approx. =1300/sup 0/C. Surface treatment in the gas mixture did not cause further agglomeration of the powder.
- Research Organization:
- Lawrence Berkeley Lab., Berkeley, CA 94720
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 6963240
- Journal Information:
- Am. Ceram. Soc. Bull.; (United States), Journal Name: Am. Ceram. Soc. Bull.; (United States) Vol. 65:8; ISSN ACSBA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102 -- Chemical & Spectral Procedures
ALKALI METALS
AMORPHOUS STATE
CARBIDES
CARBON
CARBON COMPOUNDS
CHALCOGENIDES
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CHLORINE
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
FLUORINE
HALOGENS
IMPURITIES
ION MICROPROBE ANALYSIS
IONIZING RADIATIONS
IRON
MASS SPECTROSCOPY
METALS
MICROANALYSIS
MICROSCOPY
NITRIDES
NITROGEN COMPOUNDS
NONDESTRUCTIVE ANALYSIS
NONMETALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
PNICTIDES
POWDERS
RADIATIONS
SILICON CARBIDES
SILICON COMPOUNDS
SILICON NITRIDES
SODIUM
SPECTROSCOPY
SURFACE PROPERTIES
SURFACE TREATMENTS
TRANSITION ELEMENTS
TRANSMISSION ELECTRON MICROSCOPY
VERY HIGH TEMPERATURE
X RADIATION