Using a new generation of multimeters to measure the quantized resistance
Conference
·
OSTI ID:6949654
- National Inst. of Standards and Technology, Gaithersburg, MD (USA)
- Shanghai Univ., SH (China)
- Federal Office of Metrology, Waben/Bern (Switzerland)
- Sandia National Labs., Albuquerque, NM (USA)
A new generation of digital multimeters was used to compare the ratios of the resistances of wire-wound reference resistors and quantized Hall resistances. The accuracies are better than 0.1 ppM for ratios as large as 4:1 if the multimeters are calibrated with a Josephson array. 9 refs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA); National Inst. of Standards and Technology, Gaithersburg, MD (USA)
- Sponsoring Organization:
- DOE/DP
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6949654
- Report Number(s):
- SAND-90-0081C; CONF-900689--1; ON: DE90005316
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ACCURACY
AUTOMATION
CALIBRATION
COMPARATIVE EVALUATIONS
DESIGN
DIGITAL SYSTEMS
ELECTRICAL EQUIPMENT
EQUIPMENT
HALL EFFECT
JOSEPHSON EFFECT
MEASURING INSTRUMENTS
MEASURING METHODS
RECOMMENDATIONS
RESEARCH PROGRAMS
RESISTORS
SAMPLING
STANDARDS
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ACCURACY
AUTOMATION
CALIBRATION
COMPARATIVE EVALUATIONS
DESIGN
DIGITAL SYSTEMS
ELECTRICAL EQUIPMENT
EQUIPMENT
HALL EFFECT
JOSEPHSON EFFECT
MEASURING INSTRUMENTS
MEASURING METHODS
RECOMMENDATIONS
RESEARCH PROGRAMS
RESISTORS
SAMPLING
STANDARDS