Nuclear radiation test of a D flip-flop IC using a single-board microcomputer
The design of a microcomputer-controlled electronic circuit and its use in evaluating the effects of nuclear radiation on a 4013 CMOS D flip-flop (FF) integrated circuit (IC) are described. The IC undergoing testing is attached to a DUT (device under test) board, which is enclosed in a metal container. The container is then lowered to the cobalt 60 radiation source located at the bottom of a 15-ft-deep pool filled to the top with water. The gamma-ray radiation test setup is schematically shown. The in-source test board containing the D FF IC is attached to an 8085-based single-board microcomputer, SDK-85, by a 30-ft multiconductor cable. Doses of gamma-ray radiation from the cobalt 60 are applied in steps at increasing quantities until the D FF IC, which is tested between doses, begins to malfunction. The leakage current and the propagation delay time are measured between doses. An 8085 assembly language program is used for functional test of the IC. The software design and the radiation testing procedure are discussed in detail.
- Research Organization:
- Naval Research Lab. (US)
- OSTI ID:
- 6948785
- Journal Information:
- IEEE Circuits Devices; (United States), Journal Name: IEEE Circuits Devices; (United States) Vol. 3:1; ISSN ICDME
- Country of Publication:
- United States
- Language:
- English
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