AES and EELS analysis of TlBaCaCuO sub x thin films at 300 K and at 100 K

Conference · Wed Feb 01 04:00:00 EST 1989 · AIP Conference Proceedings (American Institute of Physics); (USA)

OSTI ID:6948432

Nelson, A J; Swartzlander, A; Kazmerski, L L ^[1]; Kang, J H; Kampwirth, R T; Gray, K E ^[2]

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1. Solar Energy Research Institute, Golden, CO 80401 (USA)
2. Argonne National Laboratory, Argonne, Illinois 60439 (USA)

Auger electron spectroscopy line-shape analysis of the Tl(NOO), Ba(MNN), Ca(LMM), Cu(LMM) and O(KLL) peaks has been performed in conjunction with electron energy loss spectroscopy (EELS) on magnetron sputter deposited TlBaCaCuO{sub x} thin films a superconducting onset at 110 K with zero resistance at 96 K. AES and EELS analyses were performed at 300 K and at 100 K. Changes in the Auger line shapes and in the EELS spectra as the temperature is lowered below the critical point are related to changes in the electronic structure of states in the valence band (VB). Bulk and surface plasmon peaks are identified in the EELS spectra along with features due to core level transitions. Electron beam and ion beam induced effects are also addressed.

• DOE Contract Number: AC02-83CH10093; W-31109-ENG-38
• OSTI ID: 6948432
• Report Number(s): CONF-881035--
• Conference Information: Journal Name: AIP Conference Proceedings (American Institute of Physics); (USA) Journal Volume: 182:1
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
AUGER ELECTRON SPECTROSCOPY
BARIUM COMPOUNDS
BARIUM OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON SPECTROSCOPY
ELECTRONIC STRUCTURE
FILMS
MEASURING METHODS
OXIDES
OXYGEN COMPOUNDS
PEROVSKITES
PHYSICAL PROPERTIES
PLASMONS
QUASI PARTICLES
SAMPLE PREPARATION
SPECTROSCOPY
SPUTTERING
SUPERCONDUCTIVITY
THALLIUM COMPOUNDS
THALLIUM OXIDES
THIN FILMS