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AES (auger electron spectroscopy) and EELS (electron energy loss spectroscopy) analysis of TlBaCaCuO/sub x/ thin films at 300 K and at 100 K

Conference ·
OSTI ID:6553523
Auger electron spectroscopy line-shape analysis of the Tl(NOO), Ba(MNN), Ca(LMM), Cu(LMM) and O(KLL) peaks has been performed in conjunction with electron energy loss spectroscopy (EELS) on magnetron sputter deposited TlBaCaCuO/sub x/ thin films exhibiting a superconducting onset at 110K with zero resistance at 96K. AES and EELS analyses were performed at 300K and at 100K. Changes in the Auger line shapes and in the EELS spectra as the temperature is lowered below the critical point are related to changes in the electronic structure of states in the valence band (VB). Bulk and surface plasmon peaks are identified in the EELS spectra along with features due to core level transitions. Electron beam and ion beam induced effects are also addressed. 13 refs., 3 figs., 1 tab.
Research Organization:
Argonne National Lab., IL (USA); Solar Energy Research Inst., Golden, CO (USA)
DOE Contract Number:
W-31109-ENG-38; AC02-83CH10093
OSTI ID:
6553523
Report Number(s):
CONF-8810278-1; ON: DE89004271
Country of Publication:
United States
Language:
English