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Infrared absorption of electron irradiation induced deep defects in semi-insulating GaAs

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.100229· OSTI ID:6945775

Electron irradiation induced defects in semi-insulating GaAs grown by the liquid-encapsulated Czochralski technique were studied using infrared absorption spectroscopy. A broad peak (P1) and a shoulder (P2) were observed in the infrared absorption spectra of the irradiated materials at 0.98 and 0.78 eV, respectively. The electron-phonon coupling strength as well as the Franck--Condon shift of P1 was estimated from the temperature dependence of the linewidth. The annealing kinetics between 375 and 450 /sup 0/C show that the P1 defect vanishes by a long-range migration process with an enthalpy of 0.78 +- 0.02 eV. A speculation for the atomic structure of P1 is presented.

Research Organization:
Air Force Wright Aeronautical Laboratories, Materials Laboratory (AFWAL/MLPO), Wright--Patterson Air Force Base, Ohio 45433-6533
OSTI ID:
6945775
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 53:24; ISSN APPLA
Country of Publication:
United States
Language:
English