Intercascade annihilation of freely migrating defects
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
To characterize putative interactions between freely migrating defects (FMD) and remnants of energetic displacement cascades, radiation-induced segregation (RIS) in Cu-1 at. % Au was measured by Rutherford backscattering during separate and simultaneous irradiation at 400 {degree}C with 1.5 MeV He and 800 keV Cu ions. The strong RIS observed during only He irradiation was greatly reduced under simultaneous Cu irradiation at approximately the same displacements per atom rate; increasing the Cu flux by a factor of 5 suppressed the RIS from the He beam almost completely. The suppression of RIS at 400 {degree}C disappeared quickly when the Cu irradiation ceased. These results demonstrate that a transient population of interstitial and/or vacancy clusters from the Cu irradiation greatly reduces the survival rate of FMD produced by the He. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 69438
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 2 Vol. 67; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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