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Surface crystallography from low-energy ion backscattering angular distributions. [3-keV He/sup +/ ions]

Journal Article · · J. Phys. Chem.; (United States)
DOI:https://doi.org/10.1021/j100208a002· OSTI ID:6941557
;
A new method for obtaining the arrangement of atoms at an ordered surface and for determining surface relaxations (to within 2% of interplanar spacings) by use of low-energy ions is presented. The method is illustrated with a computer simulation to generate the backscattered intensity distribution for 3-keV He/sup +/ ions normally incident on a Cu(001) surface. When displayed on a position-sensitive detector, the total backscattered yield would reveal blocking-cone features that are real-space images of surface atoms.
Research Organization:
Univ. of California, Los Angeles
OSTI ID:
6941557
Journal Information:
J. Phys. Chem.; (United States), Journal Name: J. Phys. Chem.; (United States) Vol. 86:11; ISSN JPCHA
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
ANGULAR DISTRIBUTION
BACKSCATTERING
BEAMS
CHEMICAL ANALYSIS
COPPER
CRYSTALLOGRAPHY
DISTRIBUTION
ELEMENTS
ION BEAMS
ION SCATTERING ANALYSIS
METALS
NONDESTRUCTIVE ANALYSIS
SCATTERING
SPECTROSCOPY
SURFACES
TRANSITION ELEMENTS