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Laser conditioning of optical thin films

Conference ·
DOI:https://doi.org/10.1117/12.2294445· OSTI ID:6935052
Results are presented that show the damage thresholds of e-beam deposited multi-layer HfO{sub 2}/SiO{sub 2} thin films can be permanently increased by a factor of 2 to 3 by illumination with subthreshold fluences of laser light. This subthreshold illumination procedure is referred to as laser conditioning.'' The films used in this study were prepared by three different physical-vapor-deposition techniques: ion-beam sputtering, plasma plating and e-beam evaporation. Only the e-beam deposited films showed consistent and significant improvement with laser conditioning. Of the material pairs examined (HfO{sub 2}/SiO{sub 2}, ZrO{sub 2}/SiO{sub 2} and TiO{sub 2}/SiO{sub 2}), HfO{sub 2}/SiO{sub 2} gave the greatest and most consistent damage improvement with conditioning. The number of layers and the reflective or transmissive characteristics of the HfO{sub 2}/SiO{sub 2} films were found to have little impact on laser conditioning of the film. The results show that the damage thresholds of a wide range of e-beam deposited coatings (e.g. HR's, polarizers, etc.) can be improved by laser conditioning. Several possible conditioning mechanisms are examined. 40 refs., 10 figs.
Research Organization:
Lawrence Livermore National Lab., CA (USA)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6935052
Report Number(s):
UCRL-101641; CONF-8911192--3; ON: DE90013483
Country of Publication:
United States
Language:
English

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