Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Abrupt interfaces with novel structural and electronic properties: Metal-cluster deposition and metal-semiconductor junctions

Journal Article · · Physical Review, B: Condensed Matter; (USA)
; ; ; ; ;  [1];  [2]
  1. Department of Chemical Engineering Department of Materials Science, University of Minnesota, Minneapolis, Minnesota 55455 (USA)
  2. Lawrence Berkeley Laboratory, Berkeley, California 94720 (USA)

Abrupt interfaces with no observed substrate disruption are produced by a novel method of metal-semiconductor junction formation. This method involves the condensation of a thin Xe buffer layer on cleaved surfaces to isolate the semiconductor from impinging metal atoms. This Xe buffer layer provides a surface upon which the metal atoms diffuse, nucleate, and grow into metallic clusters. These clusters are then brought into contact with the substrate when the Xe is thermally desorbed. The result is an abrupt, nondisrupted, nearly ideal interface. Photoemission studies of Al, Ag, Au, Ga, Ti, and Co clusters grown on {ital n}- and {ital p}-type GaAs(110) show unique Fermi-level positions {similar to}0.3 and 1.0 eV below the conduction-band minimum, respectively, that are nearly metal and coverage independent. We find no evidence that metal-induced gap states or conventional defect levels are important in determining the Fermi-level position in the gap, but photoemission results indicate surface unrelaxation around the clusters. This unrelaxation results in the reappearance of states in the gap. High-resolution electron-microscopy results for Au(clusters)/GaAs(110) show intimate contact with no intermixing at the interface, with sintering of Au clusters to form an interconnected network of metal islands at high coverages. Comparisons of these results with those for interfaces formed by atom deposition at 60 and 300 K emphasize the novel properties of the cluster interface.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
6926706
Journal Information:
Physical Review, B: Condensed Matter; (USA), Journal Name: Physical Review, B: Condensed Matter; (USA) Vol. 41:8; ISSN 0163-1829; ISSN PRBMD
Country of Publication:
United States
Language:
English

Similar Records

New phenomena in Schottky barrier formation on III--V compounds
Journal Article · Sat Jul 01 00:00:00 EDT 1978 · J. Vac. Sci. Technol.; (United States) · OSTI ID:6761377

Transition metals on GaAs(110): A case for extrinsic surface states
Journal Article · Tue Jul 01 00:00:00 EDT 1986 · J. Vac. Sci. Technol., B; (United States) · OSTI ID:5661095

A new probe of metallization microstructure on semiconductor surfaces
Conference · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) · OSTI ID:7305968