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Melting and orientational epitaxy in argon and xenon monolayers on graphite

Journal Article · · Physical Review, B: Condensed Matter; (USA)
 [1];  [2];  [3];  [4]
  1. Department of Physics, Brookhaven National Laboratory, Upton, New York, 11973-5000 (USA) Corporate Research Laboratories, Exxon Research and Engineering Company, Clinton Township, Route 22 East, Annandale, New Jersey 08801 (USA)
  2. Department of Physics, Risoe National Laboratory, DK-4000 Roskilde, Denmark (DK) Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000 (USA)
  3. Corporate Research Laboratories Exxon Research and Engineering Company, Clinton Township, Route 22 East, Annandale, New Jersey 08801 (USA)
  4. Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000 (USA)
We have studied the melting behavior for Ar at a coverage of {rho}{similar to}0.81 and the orientational-epitaxy effect for Ar and Xe. We find that the Ar melts continuously from a rotated incommensurate solid to a rotated fluid phase; the fluid with positional correlations of 400 {ital A} is rotated by {similar to}2{degree}. The melting behavior agrees well with that observed by x-ray diffraction using a {ital ZYX}-graphite substrate, and is consistent with the heat-capacity data of Migone {ital et} {ital al}. For Xe, the orientational-epitaxy data show a rotation to zero for increasing misfit magnitude, contrary to the Ar and Kr behavior. This is discussed in light of the role of entropy in the structure of this system.
DOE Contract Number:
AC02-76CH00016
OSTI ID:
6925393
Journal Information:
Physical Review, B: Condensed Matter; (USA), Journal Name: Physical Review, B: Condensed Matter; (USA) Vol. 41:7; ISSN PRBMD; ISSN 0163-1829
Country of Publication:
United States
Language:
English

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