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Title: Improved graphite furnace atomizer

Abstract

A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.

Inventors:
Publication Date:
OSTI Identifier:
6923247
Application Number:
ON: DE84011091
Assignee:
Dept. of Energy ERA-09-026489; EDB-84-084147
DOE Contract Number:
AC07-79ID01675
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION SPECTROSCOPY; ATOMIZATION; FURNACES; GRAPHITE; CARBON; ELEMENTAL MINERALS; ELEMENTS; MINERALS; NONMETALS; SPECTROSCOPY 400104* -- Spectral Procedures-- (-1987)

Citation Formats

Siemer, D.D. Improved graphite furnace atomizer. United States: N. p., 1983. Web.
Siemer, D.D. Improved graphite furnace atomizer. United States.
Siemer, D.D. 1983. "Improved graphite furnace atomizer". United States. doi:.
@article{osti_6923247,
title = {Improved graphite furnace atomizer},
author = {Siemer, D.D.},
abstractNote = {A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 1983,
month = 5
}