Radiation tolerance of the FOXFET biasing scheme for AC-coupled Si microstrip detectors
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6908028
- INFN, Padova (Italy)
- INFN, Padova (Italy) Univ. di Padova (Italy). Dipt. di Fisica
- INFN, Padova (Italy) Univ. di Modena (Italy). Facolta di Ingegneria
- CNR-FRAE, Bologna (Italy)
- Univ. di Padova (Italy). Dept. di Elettronica e Informatica
- INFN, Padova (Italy) Univ. di Cagliari (Italy). Instituto di Elettrotecnica
- INFN, Padova (Italy) Univ. di Padova (Italy). Dept. di Elettronica e Informatica
The radiation response of FOXFETs has been studied for proton, gamma and neutron exposures. The punch-through behavior, which represents the normal FET operating conditions in Si microstrip detectors, has been found to be much less sensitive to radiation damage than threshold voltage. The device performance has been elucidated by means of two-dimensional simulations. The main radiation effects have been also taken into account in the numerical analysis and separately examined.
- OSTI ID:
- 6908028
- Report Number(s):
- CONF-930704--
- Conference Information:
- Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 40:6Pt1
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERIZED SIMULATION
ELECTRICAL PROPERTIES
FIELD EFFECT TRANSISTORS
FUNCTIONS
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
RADIATION DETECTORS
RADIATION EFFECTS
RESPONSE FUNCTIONS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SI SEMICONDUCTOR DETECTORS
SIMULATION
TRANSISTORS
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERIZED SIMULATION
ELECTRICAL PROPERTIES
FIELD EFFECT TRANSISTORS
FUNCTIONS
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
RADIATION DETECTORS
RADIATION EFFECTS
RESPONSE FUNCTIONS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SI SEMICONDUCTOR DETECTORS
SIMULATION
TRANSISTORS