A low-cost infrared telemetry system for kilohertz-bandwidth data acquisition

Conference · Mon Jan 01 00:00:00 EST 1990

OSTI ID:6907739

Holder, M D

A telemetry system is described that transmits data from three 8-kHz analog inputs by means of an infrared-optical-digital communications channel. This system is used to acquire accelerometer data on a rocket sled during its 300-m flight. An optical communications channel at 950 nm is used to send digitally encoded analog signals from the sled to a fixed receiver. The signal is recorded and decoded by a computer. The transmitter includes a differential amplifier and low-pass filter for each input channel. Excitation for piezoresistive accelerometers is also provided. Each input channel is sampled and digitized at a 16-kHz rate. The transmitter is built on a single printed-circuit card measuring 7.5 cm by 23 cm, weighing less than 450 g including batteries. This system can be used on tests involving destruction of the transmitter because of its low cost. 7 figs.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOD
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 6907739
• Report Number(s): LA-UR-90-1434; CONF-9003149-2; ON: DE90010616
• Resource Relation: Conference: 3. test technology symposium, Laurel, MD (USA), 19-21 Mar 1990
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
42 ENGINEERING
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
DATA ACQUISITION
FREQUENCY ANALYSIS
MISSILES
FLIGHT TESTING
TELEMETRY
INFRARED SPECTRA
ACCELEROMETERS
COST
DATA ACQUISITION SYSTEMS
DATA TRANSMISSION
IMPACT SHOCK
IMPLEMENTATION
LIGHT EMITTING DIODES
MEASURING METHODS
MODULATION
NOISE
OPTICAL SYSTEMS
PHOTOCONDUCTIVITY
PIEZOELECTRICITY
POWER DENSITY
RECORDING SYSTEMS
COMMUNICATIONS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRICITY
MEASURING INSTRUMENTS
PHYSICAL PROPERTIES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SPECTRA
TESTING
440600* - Optical Instrumentation- (1990-)
426000 - Engineering- Components
Electron Devices & Circuits- (1990-)
990300 - Information Handling
450000 - Military Technology
Weaponry
& National Defense