A new technique for hardening optically-triggered thyristors

Conference · Sun Dec 31 23:00:00 EST 1989

OSTI ID:6907598

Carson, R F; Hughes, R C; Weaver, H T; Brennan, T M; Hammons, B E

Optically-triggered thyristors are hardened to high x-ray dose rates by the addition of a monolithically integrated compensating photodetector. Tests of discrete device arrangements show radiation-induced switching is completely inhibited up to 1.4 {times} 10{sup 9} rad (Si)/sec. 1 ref., 4 figs.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• Sponsoring Organization: DOE/DP
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6907598
• Report Number(s): SAND-90-0226C; CONF-900723--1; ON: DE90006769
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
450500* -- Military Technology
Weaponry
& National Defense-- Strategic Defense Initiative-- (1990-)
BALLISTIC MISSILE DEFENSE
DESIGN
DOSIMETRY
ELECTRO-OPTICAL EFFECTS
ELECTRONIC CIRCUITS
HARDENING
IRRADIATION
MILITARY STRATEGY
NATIONAL DEFENSE
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
PULSE CIRCUITS
RADIATION EFFECTS
RADIATION HARDENING
SATELLITES
SEMICONDUCTOR DEVICES
TESTING
THYRISTORS
TRIGGER CIRCUITS
VULNERABILITY
X-RAY DOSIMETRY