Surface investigations using the positron reemission microscope

Journal Article · Mon Aug 01 00:00:00 EDT 1988 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.61.488· OSTI ID:6906722

Van House, J; Rich, A

We have constructed the first positron reemission microscope and taken images of a number of targets using it. The unique image contrast of this device is determined by the probability that positrons are reemitted from a specimen surface. The surface and near-surface defect sensitivity of the positron reemission microscope is demonstrated, as well as the feasibiltiy of imaging biological specimens and semiconductor devices. Applications are discussed.

• Research Organization: Department of Physics, The University of Michigan, Ann Arbor, Michigan 48109
• OSTI ID: 6906722
• Journal Information: Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 61:5; ISSN PRLTA
• Country of Publication: United States
• Language: English

Related Subjects

656002* -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNIHILATION
ANTILEPTONS
ANTIMATTER
ANTIPARTICLES
BASIC INTERACTIONS
BIOLOGICAL MATERIALS
COLLISIONS
DESIGN
ELECTROMAGNETIC INTERACTIONS
ELEMENTARY PARTICLES
ELEMENTS
FERMIONS
INTERACTIONS
ION MICROSCOPES
ION MICROSCOPY
LEPTONS
MATERIALS
METALS
MICROSCOPES
MICROSCOPY
MOLYBDENUM
POSITRON COLLISIONS
POSITRONS
RESOLUTION
SEMICONDUCTOR MATERIALS
TRANSITION ELEMENTS
TUNGSTEN