Submicron-resolution study of a thin Ni crystal using a brightness-enhanced positron reemission microscope

Journal Article · Mon Aug 01 00:00:00 EDT 1988 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.61.492· OSTI ID:6852671

Brandes, G R; Canter, K F; Mills, Jr, A P

A 1500-A Ni(100) film is back illuminated with 5-keV positrons from a brightness-enhanced slow positron beam. Some of the positrons diffuse through the film and are emitted from the front surface by virtue of the Ni having a negative positron affinity. An immersion objective and projector lens forms a 1150 x image of the reemitted positrons at a 2D position-sensitive detector. With a resolution of 3000 +- 1000 A we observe patches attributable to positron trapping at boundary layers inside the film. The advantages and ultimate capabilities of the positron reemission microscope are also discussed.

• Research Organization: Physics Department, Brandeis University, Waltham, Massachusetts 02254 ATandT Bell Laboratories, Murray Hill, New Jersey 07974
• OSTI ID: 6852671
• Journal Information: Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 61:5; ISSN PRLTA
• Country of Publication: United States
• Language: English

Related Subjects

656002* -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNIHILATION
ANTILEPTONS
ANTIMATTER
ANTIPARTICLES
BASIC INTERACTIONS
BEAMS
COLLISIONS
DESIGN
ELECTROMAGNETIC INTERACTIONS
ELEMENTARY PARTICLES
ELEMENTS
FERMIONS
INTERACTIONS
ION MICROSCOPES
ION MICROSCOPY
LEPTON BEAMS
LEPTONS
METALS
MICROSCOPES
MICROSCOPY
NICKEL
PARTICLE BEAMS
POSITRON BEAMS
POSITRON COLLISIONS
POSITRONS
RESOLUTION
TRANSITION ELEMENTS