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Beta backscatter measurements of aluminum ion plating on U-0. 75 Ti parts

Technical Report ·
DOI:https://doi.org/10.2172/6901853· OSTI ID:6901853
The beta-backscatter method of measuring thin laminates on thick substrates was evaluated for possible production inspection applications of aluminum ion plating on U-0.75 Ti parts. The choice of radiation source, the effects of surface curvature, and background radiation from uranium isotopes were examined. Measurements of aluminum coatings on U-0.75 Ti test coupons and cylindrical parts were made with the ..beta..-backscatter technique and compared to ..cap alpha..-transmission measurements.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6901853
Report Number(s):
SAND-80-8241
Country of Publication:
United States
Language:
English

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Related Subjects

440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACTINIDE ALLOYS
ALLOYS
ALUMINIUM
BETA RADIOGRAPHY
DEPOSITION
ELEMENTS
GEIGER-MUELLER COUNTERS
INDUSTRIAL RADIOGRAPHY
MEASURING INSTRUMENTS
METALS
PERFORMANCE
RADIATION DETECTORS
RADIOMETRIC GAGES
SPECIFICATIONS
SURFACE COATING
THICKNESS GAGES
TITANIUM ALLOYS
URANIUM ALLOYS
URANIUM BASE ALLOYS