Transient optical grating in HgCdTe

Journal Article · Fri Aug 15 04:00:00 EDT 1986 · AIP Conf. Proc.; (United States)

DOI:https://doi.org/10.1063/1.35759· OSTI ID:6882759

Lindle, J R; Bartoli, F J; Meyer, J R; Hoffman, C A

The transient grating technique has been used to study ambipolar diffusion and free carrier recombination in HgCdTe. The grating is created by the interference of two coherent 1.06 ..mu..m, 1 nsec pulses from a Nd:YAG laser. Decay of the grating is monitored by observing the first-order diffraction of a 1 ..mu..s, 10.6 ..mu..m laser pulse which is synchronized with the pump pulses. Ambipolar diffusion dominates the decay at small grating spacings and low excitation levels, while recombination is more important when the grating spacing is larger.

• Research Organization: Naval Research Laboratory, Washington, DC 20375
• OSTI ID: 6882759
• Report Number(s): CONF-851185-
• Journal Information: AIP Conf. Proc.; (United States), Journal Name: AIP Conf. Proc.; (United States) Vol. 146:1; ISSN APCPC
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
AMBIPOLAR DIFFUSION
CADMIUM COMPOUNDS
CADMIUM TELLURIDES
CHALCOGENIDES
CHARGE CARRIERS
DIFFUSION
ELECTROMAGNETIC RADIATION
GRATINGS
INFRARED RADIATION
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
MERCURY COMPOUNDS
MERCURY TELLURIDES
NONDESTRUCTIVE TESTING
RADIATION DETECTORS
RADIATIONS
RECOMBINATION
SEMICONDUCTOR MATERIALS
TELLURIDES
TELLURIUM COMPOUNDS
TESTING
TRANSIENTS