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Surface superconductivity and the metal-oxide-semiconductorsystem

Journal Article · · Phys. Rev. Lett.; (United States)
Phonon-mediated and dynamically screened interactions between inversion-layer electrons in metal-oxide-semiconductor devices are studied. A numerical solution of the superconducting gap equation in the weak-coupling limit as a function of electron density for the Si(111)-SiO/sub 2/ system is given. Results are obtained for T/sub c/ which demonstrate that at high densities (with T/sub c/< or approx. =10 mK), pairing is dominated by intervalley phonon exchange, whereas at low densities it is essentially due to exchange of electronic (plasmon, electron-hole) excitations.
Research Organization:
Max-Planck-Institut fuer Festkoerperforschung, D-7000 Stuttgart 80, Federal Republic of Germany
OSTI ID:
6876701
Journal Information:
Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 45:14; ISSN PRLTA
Country of Publication:
United States
Language:
English