ISTFA 1987 - International Symposium for Testing and Failure Analysis: Microelectronics; Proceedings of the Symposium, Los Angeles, CA, Nov. 9-13, 1987
Conference
·
OSTI ID:6876286
The papers presented in this volume provide an overview of recent developments in the failure analysis method and techniques used in microelectronics. General topics discussed include GaAs device failure analysis, transmission electron microscopy for failure analysis, EOS/ESD analysis, interconnections and coatings analysis, and failure modes and mechanisms. Papers are included on dominant failure modes in GaAs D-MESFET integrated circuits, TEM sample preparation methods to inspect integrated circuit structures, surface analysis of contamination in thin film coatings, and evaluation of optical fibers for space use.
- OSTI ID:
- 6876286
- Report Number(s):
- CONF-8711255-
- Country of Publication:
- United States
- Language:
- English
Similar Records
ISTFA 1986 - International Symposium for Testing and Failure Analysis; Proceedings of the Symposium, Los Angeles, CA, Oct. 20-24, 1986
ISTFA 1987 - International Symposium for Testing and Failure Analysis: Advanced materials; Proceedings of the Symposium, Los Angeles, CA, Nov. 9-13, 1987
ISTFA 1988 - International Symposium for Testing and Failure Analysis; Proceedings of the Symposium, Los Angeles, CA, Oct. 31-Nov. 4, 1988
Conference
·
Tue Dec 31 23:00:00 EST 1985
·
OSTI ID:5678996
ISTFA 1987 - International Symposium for Testing and Failure Analysis: Advanced materials; Proceedings of the Symposium, Los Angeles, CA, Nov. 9-13, 1987
Conference
·
Wed Dec 31 23:00:00 EST 1986
·
OSTI ID:6893530
ISTFA 1988 - International Symposium for Testing and Failure Analysis; Proceedings of the Symposium, Los Angeles, CA, Oct. 31-Nov. 4, 1988
Conference
·
Thu Dec 31 23:00:00 EST 1987
·
OSTI ID:5920582
Related Subjects
42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
ARSENIC COMPOUNDS
ARSENIDES
COATINGS
COMPUTERS
DIRECT ENERGY CONVERTERS
ELECTRON MICROSCOPY
ELECTRONIC CIRCUITS
EQUIPMENT
FABRICATION
FAILURES
FIBERS
FIELD EFFECT TRANSISTORS
FILMS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
JOINING
MEETINGS
MICROELECTRONIC CIRCUITS
MICROELECTRONICS
MICROPROCESSORS
MICROSCOPY
OPTICAL FIBERS
PACKAGING
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
PNICTIDES
PROTECTIVE COATINGS
SCHOTTKY BARRIER DIODES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SOLAR CELLS
SOLAR EQUIPMENT
SOLDERING
TESTING
THIN FILMS
TRANSISTORS
TRANSMISSION ELECTRON MICROSCOPY
WELDING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
ARSENIC COMPOUNDS
ARSENIDES
COATINGS
COMPUTERS
DIRECT ENERGY CONVERTERS
ELECTRON MICROSCOPY
ELECTRONIC CIRCUITS
EQUIPMENT
FABRICATION
FAILURES
FIBERS
FIELD EFFECT TRANSISTORS
FILMS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
JOINING
MEETINGS
MICROELECTRONIC CIRCUITS
MICROELECTRONICS
MICROPROCESSORS
MICROSCOPY
OPTICAL FIBERS
PACKAGING
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
PNICTIDES
PROTECTIVE COATINGS
SCHOTTKY BARRIER DIODES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SOLAR CELLS
SOLAR EQUIPMENT
SOLDERING
TESTING
THIN FILMS
TRANSISTORS
TRANSMISSION ELECTRON MICROSCOPY
WELDING