Scintillation detection with large-area reach-through avalanche photodiodes
Silicon avalanche photodiodes of the ''reachthrough'' type have been used as scintillation detectors with device performance closely approaching that of PMT's. The device consists of a 6X6mm diode with a 5X5mm photosensitive area in a 6.7X6.7X2.0mm package which is suitable for mounting in an array. Typical characteristics at room temperature are: quantum efficiency =50% at lambda=415nm; surface dark current <200nA; bulk dark-current (before gain) <1nA; noise current (at optimum gain of 20 to 50) <1pA/Hz/SUP 1/2/; response time <5ns; capacitance =21pF; biasing voltage =200-400 Volts. When coupled to a NaI(T1) scintillator (9X9X38mm) photo-peak resolutions (FWHM) for 662keV radiation of 10.4% at 21/sup 0/C and 9.8% at 0/sup 0/C were measured. The measured noise equivalent primary charge of one detector at a gain of 50 was 121 electrons (51 electrons rms) at room temperature. The significance of this new detector to high resolution imaging systems and detector arrays is discussed.
- Research Organization:
- RCA Inc., Electro-Optics, Ste-Anne-de-Bellevue, Quebec, H9X 3L3
- OSTI ID:
- 6869738
- Report Number(s):
- CONF-831015-
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 31:1; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFICATION
AVALANCHE QUENCHING
CAPACITANCE
CATHODES
COUNTING TECHNIQUES
CURRENTS
DATA
EFFICIENCY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ELECTRODES
ENERGY RANGE
GAIN
INFORMATION
KEV RANGE
KEV RANGE 100-1000
MEASURING INSTRUMENTS
NAI DETECTORS
NOISE
NUMERICAL DATA
PEAKS
PERFORMANCE
PHOTOCATHODES
PHOTOCURRENTS
PHOTODIODES
PHOTOSENSITIVITY
PHYSICAL PROPERTIES
QUANTUM EFFICIENCY
RADIATION DETECTORS
RESOLUTION
SCINTILLATION COUNTERS
SCINTILLATION COUNTING
SCINTILLATOR-PHOTODIODE DETECTORS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SENSITIVITY
SI SEMICONDUCTOR DETECTORS
SOLID SCINTILLATION DETECTORS
SPATIAL RESOLUTION
TIMING PROPERTIES