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Intrinsic trapping sites in rare-earth and yttrium oxyorthosilicates

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.371518· OSTI ID:686850
; ; ; ; ;  [1]
  1. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

Similarity among the thermally stimulated luminescence glow curves of undoped Lu{sub 2}SiO{sub 5} and Ce{sup 3+}-doped oxyorthosilicates possessing the monoclinic C2/c structure strongly suggests the luminescence traps are intrinsic in origin. They are most likely associated with the configuration of oxygen ions in the vicinity of not only the Ce{sup 3+} ion, as suggested in previous work, but also the host lanthanide ion. The optical absorption spectrum of pristine Lu{sub 2}SiO{sub 5} shows the presence of intrinsic absorption centers that are enhanced upon x irradiation as seen in other oxides containing oxygen related point defects. {copyright} {ital 1999 American Institute of Physics.}

OSTI ID:
686850
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 9 Vol. 86; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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