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Atomic structure of Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} thin films on LaAlO{sub 3}

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.125071· OSTI ID:686843
 [1];  [2]; ;  [1]; ;  [2]
  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030 (United States)
  2. Department of Physics and the Texas Center for Superconductivity, University of Houston, Houston, Texas 77204 (United States)
Perovskite barium strontium titanate Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3}(BST) thin films were grown on (001) LaAlO{sub 3} (LAO) using pulsed-laser ablation. The microstructures of the {ital as}-grown BST films were studied with selected electron diffraction, transmission electron microscopy, and scanning transmission electron microscopy. The BST thin films are oriented with their [001] directions parallel to the {l_angle}102{r_angle} directions of the LAO. Both cross-sectional and plan-view studies show the BST films to be single crystals with smooth surfaces. The interfaces were seen to be atomically sharp by cross-sectional, high-resolution electron microscopy. The density of misfit dislocations was consistent with the 4.3{percent} lattice mismatch, and they were found to be dissociated into partials. {copyright} {ital 1999 American Institute of Physics.}
OSTI ID:
686843
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 17 Vol. 75; ISSN 0003-6951; ISSN APPLAB
Country of Publication:
United States
Language:
English