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Off-axis electron holography and microstructure of Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} thin films on LaAlO{sub 3}

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics
; ; ; ;  [1]; ;  [2]
  1. Beijing Laboratory of Electron Microscopy, Institute of Physics, Chinese Academy of Sciences, Beijing, 100080 (China)
  2. National Laboratory for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing, 100080 (China)
Epitaxial Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} thin films grown on the (001) LaAlO{sub 3} substrates with a ferroelectric transition at about 250 K have been investigated by TEM and off-axis electron holography. Cross-sectional TEM observations show that the 350-nm-thick Ba{sub 0.5}Sr{sub 0.5}TiO{sub 3} film has a sharp interface with notable misfit dislocations. Off-axis electron holographic measurements reveal that, at low temperatures, the ferroelectric polarization results in a remarkable positive potential on the interface and a negative potential on the film surface, and, at room temperature, certain charges could only accumulate at the interfacial dislocations and other defective areas.
OSTI ID:
20666259
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 11 Vol. 71; ISSN 1098-0121
Country of Publication:
United States
Language:
English