Electron-impact excitation of multicharged ions: Merged beams experiments

Journal Article · Tue Jun 01 04:00:00 EDT 1999 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.59232· OSTI ID:686400

Bannister, M E ^[1]; Chung, Y ^[2]; Djuric, N; Dunn, G H; Woitke, O ^[3]; Smith, A C ^[4]; Wallbank, B ^[5]

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1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)
2. Department of Physics, Chungnam National University, Gung-Dong 220, 3005-764 Daejon, South (Korea)
3. JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309-0440 (United States)
4. Department of Physics and Astronomy, University College London, London WC1E 6BT (United Kingdom)
5. Department of Physics, St. Francis Xavier University, Antigonish, Nova Scotia, Canada, B2G 2W5 (CANADA)

Electron-impact excitation cross sections for several multicharged ions have been measured near threshold using the merged electron-ion beams energy loss (MEIBEL) technique. This technique allows the investigation of optically-allowed and forbidden transitions with sufficient energy resolution, typically about 0.2 eV, to resolve resonance structures in the cross sections. Results from the JILA/ORNL MEIBEL experiment on allowed transitions in several multicharged ions demonstrate the ability of various theoretical methods to predict cross sections in the absence of resonances. Comparisons of R-matrix calculations and measured cross sections for transitions in Mg-like Si{sup 2+} and Ar{sup 6+}, however, indicate that theory must continue to evolve in order to more accurately predict cross sections involving significant contributions from dielectronic resonances and interactions between neighboring resonances. {copyright} {ital 1999 American Institute of Physics.}

• Research Organization: Oak Ridge National Laboratory
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-96OR22464; AI02-95ER54293
• OSTI ID: 686400
• Report Number(s): CONF-981122--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 475; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ARGON
CROSS SECTIONS
ELECTRON SPECTRA
ELECTRON-ION COLLISIONS
ENERGY-LEVEL TRANSITIONS
IONS
R MATRIX
SILICON