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Recent experiments on near-threshold electron-impact excitation of multiply charged ions

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.56562· OSTI ID:678849
 [1]; ; ;  [2];  [3];  [4];  [5]
  1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)
  2. JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309-0440 (United States)
  3. Department of Physics, Chungnam National University, Gung-Dong 220, 3005-764 Daejon, South (Korea)
  4. Department of Physics and Astronomy, University College London, London WC1E 6BT (United Kingdom)
  5. Department of Physics, St. Francis Xavier University, Antigonish, Nova Scotia, Canada, B2G 2W5 (CANADA)
Some recent measurements of excitation of multiply charged ions by electrons studied in beam-beam experiments are highlighted. The emphasis is on absolute total cross sections measured with the merged electron-ion beams energy-loss (MEIBEL) technique, although some results obtained with the crossed-beams fluorescence method are also presented. The MEIBEL technique allows the investigation of optically-allowed and forbidden transitions with sufficient energy resolution, typically about 0.2 eV, to resolve resonance structures in the cross sections. Results from the JILA/ORNL MEIBEL experiment on dipole-allowed transitions in several ions demonstrate the success of various theoretical methods in predicting cross sections in the absence of resonances. Comparisons of R-matrix calculations and measured cross sections for spin-forbidden transitions in Mg-like Si{sup 2+} and Ar{sup 6+}, however, show that further refinements to the theory are needed in order to more accurately predict cross sections involving significant contributions from dielectronic resonances and interactions between neighboring resonances. {copyright} {ital 1998 American Institute of Physics.}
Sponsoring Organization:
USDOE
DOE Contract Number:
AI05-86ER53237; AC05-96OR22464
OSTI ID:
678849
Report Number(s):
CONF-980365--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 443; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English