In situ fabrication of epitaxial YBa sub 2 Cu sub 3 O sub 7 films on lattice-mismatched (100) YS-ZrO sub 2 substrates by the pulsed laser evaporation method

Journal Article · Sun Apr 01 00:00:00 EST 1990 · Journal of Applied Physics; (USA)

DOI:https://doi.org/10.1063/1.345333· OSTI ID:6862452

Singh, R K; Narayan, J; Singh, A K ^[1]

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1. Department of Materials Science Department of Engineering, North Carolina State University, Raleigh, North Carolina 27695-7916 (USA)

The formation of good quality epitaxial {ital c}-axis-perpendicular YBa{sub 2} Cu{sub 3} O{sub 7} superconducting thin films on (100) yttria-stabilized-zirconia (YSZ) substrates in the temperature range of 550--650 {degree}C by a biased laser deposition method is reported. However, below 550 {degree}C, the epitaxial quality of the films decreased appreciably with corresponding changes in the superconducting properties. For temperatures much below the critical temperature, the critical current density showed a linear variation with temperature, with a value of 1.0{times}10{sup 6} A/cm{sup 2} at 77 K and zero magnetic field. Because of the lattice mismatch between the substrate and the film, the interface was found to be highly strained in the presence of a large number of defects. The epitaxial nature and the crystalline quality of the films were determined by a number of techniques including Rutherford backscattering/channeling, electron channeling, cross-section transmission electron microscopy (TEM), and x-ray diffraction techniques. Rutherford backscattering channeling showed a minimum channeling yield of about 18%--25% for films deposited at and above 550 {degree}C. Cross-section TEM and x-ray diffraction revealed the following thin film and substrate relationships: (001){sub film} {parallel}(001){sub YSZ} and (110){sub film} {parallel}(100){sub YSZ}. The electron channeling pattern taken from a large area confirmed the epitaxial relationship. The lattice parameters mismatch in this orientation has been found to gives rise to stresses near the interface.

• OSTI ID: 6862452
• Journal Information: Journal of Applied Physics; (USA), Vol. 67:7; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
DEPOSITION
COPPER OXIDES
YTTRIUM OXIDES
CHANNELING
CRITICAL CURRENT
EPITAXY
LASER RADIATION
STRAINS
STRESSES
SUBSTRATES
SUPERCONDUCTING FILMS
TEMPERATURE DEPENDENCE
TRANSMISSION ELECTRON MICROSCOPY
VAPOR DEPOSITED COATINGS
ZIRCONIUM OXIDES
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
CHALCOGENIDES
COATINGS
COPPER COMPOUNDS
CURRENTS
ELECTRIC CURRENTS
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
FILMS
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
RADIATIONS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
ZIRCONIUM COMPOUNDS
360201* - Ceramics
Cermets
& Refractories- Preparation & Fabrication