Effect of distance heuristics and circuit testability on the generation of test vectors for combinational circuits
Conference
·
OSTI ID:6853822
A heuristic decision process based on the use of a distance metric in conjunction with a nine-valued circuit model is shown to decrease the time required to generate complete single-fault-detecting test sets for combinational circuits by as much as 30%. The effectiveness of the heuristics is demonstrated to depend upon a testability measure defined as the number of equivalent two-input gates plus fanouts divided by the sum of circuit inputs and outputs.
- Research Organization:
- Sandia Labs., Albuquerque, N.Mex. (USA)
- DOE Contract Number:
- EY-76-C-04-0789
- OSTI ID:
- 6853822
- Report Number(s):
- SAND-77-1844C; CONF-780626-1
- Resource Relation:
- Conference: 15. design automation conference, Las Vegas, NV, USA, 19 Jun 1978
- Country of Publication:
- United States
- Language:
- English
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