Direct lattice imaging of polytypes in YSeF

Journal Article · Thu Jan 01 04:00:00 EST 1976 · J. Solid State Chem.; (United States)

DOI:https://doi.org/10.1016/0022-4596(76)90167-5· OSTI ID:6848809

van Dyck, D ^[1]; van Landuyt, J; Amelinckx, S; Huy-Dung, N; Dagron, C

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1. Rijksuniversitair Centrum Antwerpen, Belgium

High-resolution imaging was used to study a series of different YSeF polytypes. By comparing the images with the known structures of a few of them that had previously been characterized by x-ray diffraction, an imaging code could be derived which allows one to deduce the structures of the other polytypes from their lattice images. Mixtures of polytypes and, in some cases, frozen-in defects associated with their formation could be identified. Optical simulation of the electron diffraction patterns by means of simplified polytype models shows a fairly good agreement with the electron diffraction patterns and provides a complementary tool for the identification of the polytypes especially in those cases where no lattice images could be obtained.

• OSTI ID: 6848809
• Journal Information: J. Solid State Chem.; (United States), Journal Name: J. Solid State Chem.; (United States) Vol. 19; ISSN JSSCB
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DIFFRACTION
ELECTRON DIFFRACTION
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
SCATTERING
SELENIDES
SELENIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS