Switching measurements on Josephson memory loops
Journal Article
·
· J. Appl. Phys.; (United States)
This paper corrects and clarifies a previously reported dependence of current-transfer time on loop and junction parameters for Josephson-junction memory cells.
- Research Organization:
- Department of Electrical Engineering and Computer Sciences and the Electronics Research Laboratory, University of California, Berkeley, California 94720
- OSTI ID:
- 6847700
- Journal Information:
- J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 49:7; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Switching measurements on semiconductor-barrier Josephson junctions, isolated and in memory loops
Experimental vortex transitional nondestructive read-out Josephson memory cell
1.4 mil$sup 2$ memory cell with Josephson junctions
Journal Article
·
Thu Mar 31 23:00:00 EST 1977
· J. Appl. Phys.; (United States)
·
OSTI ID:7326240
Experimental vortex transitional nondestructive read-out Josephson memory cell
Journal Article
·
Sat Jan 14 23:00:00 EST 1989
· J. Appl. Phys.; (United States)
·
OSTI ID:6615061
1.4 mil$sup 2$ memory cell with Josephson junctions
Conference
·
Sat Mar 01 00:00:00 EDT 1975
· IEEE Trans. Magn., v. MAG-11, no. 2, pp. 755-758
·
OSTI ID:4121983