The application of scanning electron microscopy to fractography

Journal Article · Sat Oct 01 00:00:00 EDT 1994 · Materials Characterization; (United States)

DOI:https://doi.org/10.1016/1044-5803(94)90045-0· OSTI ID:6817269

Brooks, C R; McGill, B L ^[1]

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1. Univ. of Tennessee, Knoxville, TN (United States)

Many failures involve fracture, and determination of the fracture process is a key factor in understanding the failure. This is frequently accomplished by characterizing the topography of the fracture surface. Scanning electron microscopy has a prominent role in fractography due to three features of the scanning electron microscope (SEM): high resolution, great depth of field, and the ability to obtain chemical information via analysis of the X-rays generated by the electrons. A qualitative treatment is presented of the interaction of electrons with a sample and the effect of the SEM operating parameters on image formation, quality, and X-ray analysis. Fractographs are presented to illustrate these features of scanning electron microscopy and to illustrate the limitations and precautions in obtaining fractographs and x-ray analyses. The review is concluded with examples of fracture surface features of metallic, ceramic, and polymeric materials.

• OSTI ID: 6817269
• Journal Information: Materials Characterization; (United States), Vol. 33:3; ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
36 MATERIALS SCIENCE
CERAMICS
FRACTOGRAPHY
METALS
POLYMERS
SCANNING ELECTRON MICROSCOPY
PERFORMANCE
DIAGNOSTIC TECHNIQUES
FRACTURE PROPERTIES
X-RAY FLUORESCENCE ANALYSIS
CHEMICAL ANALYSIS
ELECTRON MICROSCOPY
ELEMENTS
MECHANICAL PROPERTIES
MICROSCOPY
NONDESTRUCTIVE ANALYSIS
X-RAY EMISSION ANALYSIS
420500* - Engineering- Materials Testing
360103 - Metals & Alloys- Mechanical Properties
360203 - Ceramics
Cermets
& Refractories- Mechanical Properties
360603 - Materials- Properties