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Title: The application of scanning electron microscopy to fractography

Abstract

Many failures involve fracture, and determination of the fracture process is a key factor in understanding the failure. This is frequently accomplished by characterizing the topography of the fracture surface. Scanning electron microscopy has a prominent role in fractography due to three features of the scanning electron microscope (SEM): high resolution, great depth of field, and the ability to obtain chemical information via analysis of the X-rays generated by the electrons. A qualitative treatment is presented of the interaction of electrons with a sample and the effect of the SEM operating parameters on image formation, quality, and X-ray analysis. Fractographs are presented to illustrate these features of scanning electron microscopy and to illustrate the limitations and precautions in obtaining fractographs and x-ray analyses. The review is concluded with examples of fracture surface features of metallic, ceramic, and polymeric materials.

Authors:
;  [1]
  1. (Univ. of Tennessee, Knoxville, TN (United States))
Publication Date:
OSTI Identifier:
6817269
Alternate Identifier(s):
OSTI ID: 6817269
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; (United States); Journal Volume: 33:3
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 36 MATERIALS SCIENCE; CERAMICS; FRACTOGRAPHY; METALS; POLYMERS; SCANNING ELECTRON MICROSCOPY; PERFORMANCE; DIAGNOSTIC TECHNIQUES; FRACTURE PROPERTIES; X-RAY FLUORESCENCE ANALYSIS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; MECHANICAL PROPERTIES; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS 420500* -- Engineering-- Materials Testing; 360103 -- Metals & Alloys-- Mechanical Properties; 360203 -- Ceramics, Cermets, & Refractories-- Mechanical Properties; 360603 -- Materials-- Properties

Citation Formats

Brooks, C.R., and McGill, B.L.. The application of scanning electron microscopy to fractography. United States: N. p., 1994. Web. doi:10.1016/1044-5803(94)90045-0.
Brooks, C.R., & McGill, B.L.. The application of scanning electron microscopy to fractography. United States. doi:10.1016/1044-5803(94)90045-0.
Brooks, C.R., and McGill, B.L.. Sat . "The application of scanning electron microscopy to fractography". United States. doi:10.1016/1044-5803(94)90045-0.
@article{osti_6817269,
title = {The application of scanning electron microscopy to fractography},
author = {Brooks, C.R. and McGill, B.L.},
abstractNote = {Many failures involve fracture, and determination of the fracture process is a key factor in understanding the failure. This is frequently accomplished by characterizing the topography of the fracture surface. Scanning electron microscopy has a prominent role in fractography due to three features of the scanning electron microscope (SEM): high resolution, great depth of field, and the ability to obtain chemical information via analysis of the X-rays generated by the electrons. A qualitative treatment is presented of the interaction of electrons with a sample and the effect of the SEM operating parameters on image formation, quality, and X-ray analysis. Fractographs are presented to illustrate these features of scanning electron microscopy and to illustrate the limitations and precautions in obtaining fractographs and x-ray analyses. The review is concluded with examples of fracture surface features of metallic, ceramic, and polymeric materials.},
doi = {10.1016/1044-5803(94)90045-0},
journal = {Materials Characterization; (United States)},
number = ,
volume = 33:3,
place = {United States},
year = {Sat Oct 01 00:00:00 EDT 1994},
month = {Sat Oct 01 00:00:00 EDT 1994}
}