Advances in x-ray analysis

Conference · Fri Jan 01 04:00:00 EST 1982

OSTI ID:6812337

Hubbard, C R; Barrett, C S; Leyden, D E; Predecki, P K

This book presents papers given at the 1982 Denver Conference on the Applications of X-ray Analysis. Focus is on recent developments in measurement accuracy of two-theta and intensity. Topics include accuracy in x-ray powder diffraction (the theme of the conference); search/match procedures (Powder Diffraction File); quantitative XRD analysis; XRD application and automation; x-ray stress determination (position sensitive detectors, fatigue and fracture characterization); new XRF instrumentation and techniques; XRF computer systems and mathematical corrections; and XRF general applications.

• OSTI ID: 6812337
• Report Number(s): CONF-820861-
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
ACCURACY
AUTOMATION
CHEMICAL ANALYSIS
COMPUTER CALCULATIONS
DOCUMENT TYPES
FATIGUE
FRACTURE MECHANICS
MEASURING INSTRUMENTS
MEASURING METHODS
MECHANICAL PROPERTIES
MECHANICS
MEETINGS
NONDESTRUCTIVE ANALYSIS
PROCEEDINGS
QUANTITATIVE CHEMICAL ANALYSIS
SPECTROSCOPY
STRESS ANALYSIS
USES
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTROSCOPY