Twenty-seventh annual conference applications of x-ray analysis
Conference
·
OSTI ID:6192606
Abstracts are presented of papers given at the conference. Topics covered include: special techniques in powder diffraction; specimen handling; x-ray fluorescence applications; applications of XRD and x-ray imaging; progress in the reduction of matrix effects in XRF; evaluation of XRD patterns; XRF innovations; XRD stress analysis and mathematical data analysis. (GHT)
- Research Organization:
- Denver Univ., CO (USA)
- OSTI ID:
- 6192606
- Report Number(s):
- CONF-780822-(Absts.)
- Country of Publication:
- United States
- Language:
- English
Similar Records
Advances in x-ray analysis
Advances in X-ray analysis, Vol. 28
Advances in X-ray analysis
Conference
·
Thu Dec 31 23:00:00 EST 1981
·
OSTI ID:6812337
Advances in X-ray analysis, Vol. 28
Conference
·
Mon Dec 31 23:00:00 EST 1984
·
OSTI ID:6487493
Advances in X-ray analysis
Book
·
Thu Dec 31 23:00:00 EST 1981
·
OSTI ID:6337405
Related Subjects
654001* -- Radiation & Shielding Physics-- Radiation Physics
Shielding Calculations & Experiments
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
CHEMICAL ANALYSIS
COHERENT SCATTERING
DATA ANALYSIS
DIFFRACTION
MEETINGS
NONDESTRUCTIVE ANALYSIS
SAMPLE PREPARATION
SCATTERING
STRESS ANALYSIS
USES
X-RAY DIFFRACTION
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS
Shielding Calculations & Experiments
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
CHEMICAL ANALYSIS
COHERENT SCATTERING
DATA ANALYSIS
DIFFRACTION
MEETINGS
NONDESTRUCTIVE ANALYSIS
SAMPLE PREPARATION
SCATTERING
STRESS ANALYSIS
USES
X-RAY DIFFRACTION
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS