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Reactive-element effect studied using ion implantation

Conference ·
OSTI ID:6792671
Implantation of reactive elements into metals that form chromia layers upon exposure to high temperature oxidizing environments has a very large effect on the growth rate of the oxide and adhesion of the oxide to the base alloy. We have investigated the effect of Y ion implantation on the high temperature oxidation of Fe-24Cr using Rutherford backscattering spectroscopy, secondary ion mass spectroscopy, and electron microscopy. Analytical tools have been applied to determine the spatial distribution of Y, the microstructure of the oxide, and contribution of oxygen transport to the oxidation process. Results are compared with similar experiments in Fe-Cr alloys with Y additions and with results of cation and anion tracer diffusion experiments. 51 refs., 17 figs., 3 tabs.
Research Organization:
Lawrence Livermore National Lab., CA (USA)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6792671
Report Number(s):
UCRL-99716-Rev.1; CONF-880901-2-Rev.1; ON: DE89004774
Country of Publication:
United States
Language:
English