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Rutherford-backscattering study of high-temperature oxidation of Y-implanted Fe-24Cr

Journal Article · · Oxid. Met.; (United States)
DOI:https://doi.org/10.1007/BF00846686· OSTI ID:5677312
The authors have investigated the effect of Y ion implantation on the high-temperature oxidation of Fe-24Cr using Rutherford-backscattering spectroscopy, secondary ion mass spectroscopy, and analytical electron microscopy. Results indicate that implantation of Y has a very large effect on the growth rate of the oxide compared to metals alloyed with Y. Analytical tools have been applied to determine the spatial distribution of Y, the microstructure of the oxide, and contribution of oxygen transport to the oxidation process. Results are compared with those of recent cation-diffusion measurements in Cr/sub 2/O/sub 3/ and Cr/sub 2/O/sub 3/ doped with Y/sub 2/O/sub 3/.
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5677312
Journal Information:
Oxid. Met.; (United States), Journal Name: Oxid. Met.; (United States) Vol. 31:3-4; ISSN OXMEA
Country of Publication:
United States
Language:
English

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