Appearance potentials of positive ions produced by electron-impact dissociative ionization of SF{sub 6}, SF{sub 5}Cl, S{sub 2}F{sub 10}, and SOF{sub 2}
Appearance potentials (APs) of positive ions produced in the ion source of a quadrupole mass spectrometer by electron collision with the molecules SF{sub 6}, SF{sub 5}Cl, S{sub 2}F{sub 10}, and SOF{sub 2} are measured. The electron-energy scale is calibrated by comparing the ion onset energies with the observed onset of Ar{sup +} from argon mixed with the sample gases. The APs of the fragment ions from SF{sub 6} are in agreement with previous results. In the case of S{sub 2}F{sub 10}, which has a mass spectrum at 70 eV nearly identical to that of SF{sub 6}, the APs of the predominant fragment ions are found to be significantly lower than the corresponding ions from SF{sub 6}, e.g., SF{sub 5}{sup +} and SF{sub 3}{sup +} appear respectively at 13.2 and 13.3 eV from S{sub 2}F{sub 10} and at 15.7 and 19.7 eV from SF{sub 6}. The relevance of these results to the use of mass spectrometry for detection of discharge by-products in SF{sub 6} is discussed.
- OSTI ID:
- 67897
- Report Number(s):
- CONF-9310400--
- Journal Information:
- Bulletin of the American Physical Society, Journal Name: Bulletin of the American Physical Society Journal Issue: 13 Vol. 38; ISSN BAPSA6; ISSN 0003-0503
- Country of Publication:
- United States
- Language:
- English
Similar Records
Negative ion formation in SF/sub 6/ spark by-products
Dissociative electron attachment to S[sub 2]F[sub 10], S[sub 2]OF[sub 10], and S[sub 2]O[sub 2]F[sub 10]