Atomic resolution studies of tilt grain boundaries in NiO
The atomic structures of a number of <001> high-angle tilt grain boundaries in NiO bicrystals have been studied by high-resolution electron microscopy (HREM). Crystallinity is always maintained right up to the grain boundary (GB). Grain boundary planes bounded by a (100)-plane are preferred; however, symmetrical facets are also found at each misorientation. A tendency to match atomic planes across the GB is not only observed in symmetrical, but also in asymmetrical, GBs. Structural units can be clearly recognized in symmetrical GBs. Contrast differences suggest that a multiplicity of structural units exists for some GB configurations. Frequently symmetric GBs also show deviations from mirror symmetry. Multislice image simulations indicate that the Fresnel-like contrast associated with HREM GB images is not particularly sensitive to GB relaxation.
- Research Organization:
- Argonne National Lab., IL (USA); Arizona State Univ., Tempe (USA). Center for Solid State Science
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 6775480
- Report Number(s):
- CONF-861207-71; ON: DE87004834
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
BICRYSTALS
CHALCOGENIDES
COMPUTERIZED SIMULATION
CRYSTAL DEFECTS
CRYSTAL FACES
CRYSTAL STRUCTURE
CRYSTALS
ELECTRON MICROSCOPY
GRAIN BOUNDARIES
IMAGES
MICROSCOPY
MICROSTRUCTURE
NICKEL COMPOUNDS
NICKEL OXIDES
OXIDES
OXYGEN COMPOUNDS
POLYCRYSTALS
SIMULATION
TRANSITION ELEMENT COMPOUNDS