Grain boundaries in NiO
Conference
·
OSTI ID:6019456
Defocus-imaging and high-resolution electron microscopy (HREM) are used to study tilt grain boundaries (GB) in NiO near the <001> axis over the whole range of possible misorientation. Faceting and structural periodicities within facets are observed in high- and low-angle GBs. A reduced atomic density at high-angle GBs is suggested by the defocus behavior.
- Research Organization:
- Argonne National Lab., IL (USA)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 6019456
- Report Number(s):
- CONF-841157-66; ON: DE85006129
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
CHALCOGENIDES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DISLOCATIONS
ELECTRON MICROSCOPY
GRAIN BOUNDARIES
IMAGES
LINE DEFECTS
MICROSCOPY
MICROSTRUCTURE
NICKEL COMPOUNDS
NICKEL OXIDES
OXIDES
OXYGEN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
CHALCOGENIDES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DISLOCATIONS
ELECTRON MICROSCOPY
GRAIN BOUNDARIES
IMAGES
LINE DEFECTS
MICROSCOPY
MICROSTRUCTURE
NICKEL COMPOUNDS
NICKEL OXIDES
OXIDES
OXYGEN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY