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X-ray of diffraction and electrophysical investigation T1/sub 2/InPrTe/sub 4/

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:6774819
(ILLEGIBLE) we investigated the temperature dependences of the electrical conductivity sigma, Hall effect R, thermo-emf ..cap alpha.., and the coefficient of linear thermal expansion (CTE) of the compound Tl/sub 2/InPrTe/sub 4/. The errors in the measurements of sigma, R, ..cap alpha.., and CTE were 4, 7, 3, and 0.5%, respectively. The electrical conductivity of Tl/sub 2/InPrTe/sub 4/ at 300-630 /sup 0/K decreases (Fig. 1a), which is similar to the electrical conductivity of metals. In this range the carrier concentration does not depend upon temperature and the mobility is limited principally by scattering by the lattice. Consequently, the mobility and electrical conductivity of the above phase decrease. On the whole, variation of the Hall coefficient agrees well with the temperature dependence of the electrical conductivity of the compound Tl/sub 2/InPrTe/sub 4/. At intrinsic conductivity (from 848 /sup 0/K) Hall coefficient decreases, whereas the intrinsic-carrier concentration and electrical conductivity increase.
Research Organization:
Sumgiat Higher Technical College
OSTI ID:
6774819
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 22:6; ISSN INOMA
Country of Publication:
United States
Language:
English