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U.S. Department of Energy
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Ion-beam analysis of implanted simulated nuclear-waste glasses

Technical Report ·
OSTI ID:6765617
Pb-ion implantation, used as a means of simulating ..cap alpha..-recoil nuclei damage in nuclear waste glasses, introduces damage which affects the leach rates of the glasses. Rutherford backscattering and elastic recoil detection has been used to profile near-surface elemental compositions in leached Pb-implanted glasses. Data are given for borosilicate glasses from Savannah River Laboratories (SRP), Pacific Northwest Laboratories (PNL), the French Marcoule Laboratories, and for CFS 7740 (Pyrex). The data show wide variability in the degree of hydration and near-surface compositional changes attained as a function of Pb-ion fluence. 11 figures.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA); Paris-11 Univ., 91 - Orsay (France). Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6765617
Report Number(s):
SAND-82-0778C; CONF-820945-2; ON: DE82021725
Country of Publication:
United States
Language:
English