Uv-induced degradation of the Si-SiO sub 2 interface: Applications to the point contact solar cell
Conference
·
OSTI ID:6758923
Prior research has concentrated on damage at the Si--SiO{sub 2} interface caused by photoinjection of electrons into the oxide by near UV light. The damage processes involved may be similar to those responsible for degradation in the Stanford type, point contact solar cell (PCSC). 7 refs., 6 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- Sponsoring Organization:
- DOE/CE
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6758923
- Report Number(s):
- SAND-90-1767C; CONF-9008124--1; ON: DE90013843
- Country of Publication:
- United States
- Language:
- English
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· Applied Physics Letters
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Related Subjects
14 SOLAR ENERGY
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
36 MATERIALS SCIENCE
360601 -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
BEAMS
CHALCOGENIDES
CONCENTRATOR SOLAR CELLS
DAMAGE
DIRECT ENERGY CONVERTERS
ELECTROMAGNETIC RADIATION
ELECTRON BEAMS
ELEMENTS
EQUIPMENT
FIBER OPTICS
INTERFACES
LASERS
LEPTON BEAMS
MEASURING METHODS
OXIDES
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
POWER DENSITY
RADIATIONS
SEMICONDUCTOR DEVICES
SEMIMETALS
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SOLAR CELLS
SOLAR EQUIPMENT
SUBSTRATES
TEMPERATURE EFFECTS
THERMAL DEGRADATION
ULTRAVIOLET RADIATION
WAVELENGTHS
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
36 MATERIALS SCIENCE
360601 -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
BEAMS
CHALCOGENIDES
CONCENTRATOR SOLAR CELLS
DAMAGE
DIRECT ENERGY CONVERTERS
ELECTROMAGNETIC RADIATION
ELECTRON BEAMS
ELEMENTS
EQUIPMENT
FIBER OPTICS
INTERFACES
LASERS
LEPTON BEAMS
MEASURING METHODS
OXIDES
OXYGEN COMPOUNDS
PARTICLE BEAMS
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
POWER DENSITY
RADIATIONS
SEMICONDUCTOR DEVICES
SEMIMETALS
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SOLAR CELLS
SOLAR EQUIPMENT
SUBSTRATES
TEMPERATURE EFFECTS
THERMAL DEGRADATION
ULTRAVIOLET RADIATION
WAVELENGTHS